Surface and bulk crystallization of amorphous solid water films: Confirmation of “top-down” crystallization
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文摘

Surface and bulk crystallization of ASW are measured using TPD and IR.

Surface crystallization is found to be thickness independent.

Bulk crystallization time increases linearly with increasing film thickness.

Crystallization starts from the ASW/vacuum interface and propagates into the bulk.

Isotope-labeled experiments confirms the top-down crystallization mechanism.

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