Comparison between leaky and pulsed modes of ion extraction from an electron beam ion trap

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• 作者：Zhimin Hu ; ^{zhimin@ils.uec.ac.jp} ; Yusuke Ishiguro ; Hirofumi Watanabe ; Shunsuke Ohtani ; Nobuyuki Nakamura
• 关键词：Highly charged ions ; Dielectronic recombination ; EBIT ; Ion extraction
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2013
• 出版时间：1 March, 2013
• 年：2013
• 卷：298
• 期：Complete
• 页码：96-99
• 全文大小：478 K

文摘

We present the charge state distributions of highly charged ions extracted from an electron beam ion trap (EBIT). The distributions were obtained in the two different extraction modes, pulsed mode and leaky mode. The number ratio between adjacent charge state ions, which is an important quantity to measure dielectronic recombination cross sections with an EBIT, is compared between the two extraction modes. The results are also compared with recent theoretical predictions by Zhang et al. .