Substrate-induced dielectric polarization in thin films of lead-free (Sr0.5Bi0.5)2Mn2-xTixO6-δ perovskites grown by pulsed laser deposition
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文摘
Highly oriented SrBiMn2-xTixO6 thin films are successfully fabricated by PLD. Thicknesses between 80 and 900 nm depending on x, substrate-type and chamber pressure. Compositional A-segregation controlled by the STO substrate orientation. Dielectric response analyzed under impedance and modulus formalisms. Relaxor phenomena obtained related to NPRs formation and compositional scenario.

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