Remaining useful life prediction for an adaptive skew-Wiener process model
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- 作者：Zeyi Huang ; Zhengguo Xu ; xzg@zju.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Xiaojie Ke ; Wenhai Wang ; Youxian Sun
- 关键词：Adaptive drift ; Closed skew normal distribution ; Remaining useful life prediction ; Wiener process
- 刊名：Mechanical Systems and Signal Processing
- 出版年：2017
- 出版时间：15 March 2017
- 年：2017
- 卷：87
- 期：part_PA
- 页码：294-306
- 全文大小：909 K
文摘
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The degradation speed of industrial devices are characterized by closed skew-normal distribution.
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The a priori knowledge and historical information are made full use of in real-time model updating.
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An analytical solution for RUL prediction incorporating the complete CSN distribution of the degradation drift is presented.