Emulation-based fault analysis on RFID tags for robustness and security evaluation

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• 作者：Ibrahim Mezzah^a ; ^b ; ^{imezzah@cdta.dz} ; Hamimi Chemali^b ; Omar Kermia^a ; ^{okermia@cdta.dz}
• 关键词：RFID tag ; Fault injection ; SEU emulation ; FPGA platform ; Robustness
• 刊名：Microelectronics Reliability
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：69
• 期：Complete
• 页码：115-125
• 全文大小：2605 K
• 卷排序：69

文摘

Development of an FPGA-based fault emulation system for evaluation of RFID tags. Carrying out of SEU and SET faults campaign on UHF tags. Identification of sensitive tag parts causing failures and security concerns. Deriving of suitable design actions for low-cost RFID security improvement.