Contouring of artwork surface by fringe projection and FFT analysis

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• 作者：Spagnolo ; Giuseppe Schirripa ; Guattari ; Giorgio ; Sapia ; Carmine ; Ambrosini ; Dario ; Paoletti ; Domenica ; et. al.
• 关键词：Projection grating ; Phase map ; Shape measurement ; Fourier transform
• 刊名：Optics and Lasers in Engineering
• 出版年：2000
• 出版时间：February, 2000
• 年：2000
• 卷：33
• 期：2
• 页码：141-156
• 全文大小：755 K

文摘

In the present work, we propose a simple optical method to perform profilometry on works of art. The method is based on the projection of a Ronchi grating onto the surface to be analyzed. When viewed at an angle different from the projection angle, the grid pattern appears deformed by the surface shape. This pattern is digitized, by a high-resolution CCD camera, and then processed using a Fourier transform analysis. The technique is free from the errors caused by higher harmonic components of the grating pattern. Furthermore, the method relies on very simple equipment and it is therefore suitable for in situ measurements. Theoretical details and examples of the technique in operation are given.