Microstructure and nanoscale piezoelectric/ferroelectric properties in Ln₂Ti₂O₇ (Ln = La, Pr and Nd) oxide thin films grown by pulsed laser deposition

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• 作者：Alex ; re Bayart ; S茅bastien Saitzek ; Anthony Ferri ; Rapha毛lle Pouhet ; Marie-H茅l猫ne Chambrier ; Pascal Roussel ; Rachel Desfeux
• 关键词：Thin films ; Oxide ; Ferroelectric ; X-ray diffraction ; Pulsed laser deposition ; Piezoresponse force microscopy
• 刊名：Thin Solid Films
• 出版年：28 February, 2014
• 年：2014
• 卷：553
• 期：Complete
• 页码：71-75
• 全文大小：554 K

文摘

Ferroelectric lead-free Ln₂Ti₂O₇ thin films (Ln = La, Pr and Nd) have been grown on (110)-oriented SrTiO₃ substrates by pulsed laser deposition. The X-ray diffraction study reveals that all films are highly (00l)-oriented. This is in good agreement with the compatibility between the film/substrate crystal lattices. The Williamson-Hall plots evidence the effect of the Ln^3 + cation size on the micro-strain in the film while the average size of the crystallites deduced from these plots is shown to correlate the average size of the dense grains, as observed by atomic force microscopy. Finally, through piezoloops recording carried out by piezoresponse force microscopy, nanoscale ferroelectricity is highlighted in these layered-perovskite Ln₂Ti₂O₇ films. These results confirm that these lead-free oxides can be used as functional material in nanoelectronic devices.