Segregation anisotropy of Sn on different crystallographic orientation surfaces of coarse-grained Zircaloy-4
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文摘
X-ray photoelectron spectroscopy (XPS) technique was utilized to study the correlation between the tendency of Sn surface segregation and the crystallographic orientation of grain surface in coarse-grained (0.2–0.8 mm in diameter) Zircaloy-4 specimen. The results indicated that the intensity of Sn surface segregation was in an order of sn=01694332&md5=c6119043f29b527f1626663cccb97cf6">View the MathML source, and it was in agreement with the prediction from bond-breaking theory.

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