Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor
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- 作者：Ko-ichiro Miyamotoa ; b ; k-miya@ecei.tohoku.ac.jp" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; Bing YuaAuthor Vitae ; Hiroko IsodacAuthor Vitae ; Torsten Wagnerb ; dAuthor Vitae ; Michael J. Schö ; ningb ; dAuthor Vitae ; Tatsuo Yoshinobua ; eAuthor Vitae
- 关键词：Chemical imaging sensor ; Scanning photo-induced impedance microscopy ; Wound-healing assay ; Cell migration assay
- 刊名：Sensors & Actuators: B. Chemical
- 出版年：2016
- 出版时间：29 November 2016
- 年：2016
- 卷：236
- 期：Complete
- 页码：965-969
- 全文大小：2059 K
文摘
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Chemical imaging sensor was applied to visualize the defect of cultured cell layer.
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Spatial distribution of resistivity of the cell layer was successfully mapped.
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The migration process of the defect was also monitored by the changes of photocurrent distribution.