Enhanced roughness of lipid membranes caused by external electric fields

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• 作者：M. Neek-Amal ; H. Rafii-Tabar ; H.R. Sepangi
• 关键词：Lipid membrane roughness ; Canham– ; Helfrich Hamiltonian ; Surface tension ; Bending rigidity
• 刊名：Computational Materials Science
• 出版年：2007
• 出版时间：December 2007
• 年：2007
• 卷：41
• 期：2
• 页码：202-207
• 全文大小：258 K

文摘

The behavior of lipid membranes in the presence of an external electric field is studied and used to examine the influence of such fields on membrane parameters such as roughness and show that for a micro sized membrane, roughness grows as the field increases. The dependence of bending rigidity on the electric field is also studied and an estimation of thickness of the accumulated charges around lipid membranes in a free-salt solution is presented.