Current-voltage and low-frequency noise analysis of heterojunction diodes with various passivation layers
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- 作者：Young-Uk Ko ; Ho-Jin Yun ; Kwang-Seok Jeong ; Yu-Mi Kim ; Seung-Dong Yang ; Seong-Hyeon Kim ; Jin-Sup Kim ; Jin-Un An ; Hi-Deok Lee ; Ga-Won Lee ; gawon@cnu.ac.kr" class="auth_mail" title="E-mail the corresponding author
- 关键词：Heterojunction diode ; Passivation layer ; Low frequency noise ; Reverse leakage current ; Poole&ndash ; Frenkel effect
- 刊名：Thin Solid Films
- 出版年：2016
- 出版时间：1 January 2016
- 年：2016
- 卷：598
- 期：Complete
- 页码：109-114
- 全文大小：1154 K
文摘
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Leakage current is on Poole–Frenkel in heterojunction diode with inferior interface.
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Low-frequency noise is proposed to evaluate heterojunction diode.
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Low-frequency noise is useful to distinguish the leakage conduction mechanism.