Elemental X-ray imaging using the Maia detector array: The benefits and challenges of large solid-angle

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• 作者：C.G. Ryan ; R. Kirkham ; R.M. Hough ; G. Moorhead ; D.P. Siddons ; M.D. de Jonge ; D.J. Paterson ; G. De Geronimo ; D.L. Howard ; J.S. Cleverley
• 关键词：SXRF ; PIXE ; Dynamic analysis ; X-ray microprobe ; Silicon detector ; Trace element imaging ; Fundamental parameter method
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2010
• 出版时间：1 July 2010-21 July 2010
• 年：2010
• 卷：619
• 期：1-3
• 页码：37-43
• 全文大小：697 K

文摘

The fundamental parameter method for quantitative SXRF and PIXE analysis and imaging using the dynamic analysis method is extended to model the changing X-ray yields and detector sensitivity with angle across large detector arrays. The method is implemented in the GeoPIXE software and applied to cope with the large solid-angle of the new Maia 384 detector array and its 96 detector prototype developed by CSIRO and BNL for SXRF imaging applications at the Australian and NSLS synchrotrons. Peak-to-background is controlled by mitigating charge-sharing between detectors through careful optimization of a patterned molybdenum absorber mask. A geological application demonstrates the capability of the method to produce high definition elemental images up to 100 M pixels in size.