Traceable measurement and imaging of the complex permittivity of a multiphase mineral specimen at micron scales using a microwave microscope

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• 作者：A.P. Gregory^a ; ^{andrew.gregory@npl.co.uk} ; J.F. Blackburn^a ; T.E. Hodgetts^b ; R.N. Clarke^a ; K. Lees^a ; S. Plint^c ; G.A. Dimitrakis^c
• 关键词：Scanning microscopes ; Permittivity measurement ; Loss tangent measurement ; Microwave heating ; Multiphase materials ; Mineral characterisation ; Imaging
• 刊名：Ultramicroscopy
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：172
• 期：Complete
• 页码：65-74
• 全文大小：1331 K
• 卷排序：172

文摘

Imaging of the dielectric permittivity and loss tangent of high loss materials. Comparison of measurements with spherical and conical tips. Studies effects of dielectric boundaries on measurements. Measurements traceable to dielectric reference data for single crystals.