Raman spectroscopy of La₂NiMnO₆ films on SrTiO₃ (1 0 0) and LaAlO₃ (1 0 0) substrates: Observation of epitaxial strain

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• 作者：James Burgess ; Haizhong Guo ; Arunava Gupta ; Shane Street
• 关键词：Raman microscopy ; Strain analysis ; La₂MnNiO₆ ; Multiferroic thin films
• 刊名：Vibrational Spectroscopy
• 出版年：2008
• 出版时间：18 September 2008
• 年：2008
• 卷：48
• 期：1
• 页码：113-117
• 全文大小：458 K

文摘

La₂NiMnO₆ is a multiferroic material of interest due to its unique dielectric and electrical resistance properties under an applied magnetic field. Raman spectroscopy was used to monitor the quality of La₂NiMnO₆ films grown on LaAlO₃ (1 0 0) and SrTiO₃ (1 0 0) substrates. The films have strikingly different properties at the film–substrate interface owing to the relative quality of heteroepitaxial growth. The films grown on SrTiO₆ (1 0 0) did not have any biaxial strain, because of strong epitaxial match to the substrate. The films grown on LaAlO₆ (1 0 0), however, showed large shifts in the A_g and B_g phonon modes due to biaxial strain. This was observed in both depth profile experiments in 200 nm films using confocal microscopy and in thinner films (down to 10 nm) grown on the substrates.