Molecular beam epitaxy of thick InGaN(0001) films: Effects of substrate temperature on structural and electronic properties
详细信息 查看全文
- 作者：E. Papadomanolakia ; elpapad@physics.uoc.gr" class="auth_mail" title="E-mail the corresponding author ; C. Baziotib ; S.A. Kazazisa ; M. Androulidakic ; G.P. Dimitrakopulosb ; E. Iliopoulosa ; c
- 关键词：A1. Crystal Structure ; A1. High-Resolution X-ray diffraction ; A3. Molecular Beam Epitaxy ; B1. Nitrides
- 刊名：Journal of Crystal Growth
- 出版年：2016
- 出版时间：1 March 2016
- 年：2016
- 卷：437
- 期：Complete
- 页码：20-25
- 全文大小：2572 K
文摘
- •
RF-MBE growth of thick InGaN(0001) films on GaN/Al2O3 with content close to the miscibility gap.
- •
Effects of substrate temperature on the films' structural and electronic properties are studied.
- •
Lower growth temperatures lead to higher structural quality films with record-high mobilities.
- •
Increase growth temperature lead to deteriorated structures and phase separation.