Influence of annealing on microstructure and optical properties of hot wall deposited PbxSn(1 − x)S thin films
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- 作者：S.A. Bashkirova ; sp-box@yandex.ru" class="auth_mail" title="E-mail the corresponding author ; V.F. Gremenoka ; V.A. Ivanova ; K. Benteb ; P.P. Gladyshevc ; T.Yu. Zelenyakc ; A.M. Saadd ; M.S. Tivanove
- 关键词：Lead-tin sulfide ; Thin films ; Microstructure ; Optical properties ; Electrical properties
- 刊名：Thin Solid Films
- 出版年：2016
- 出版时间：1 October 2016
- 年：2016
- 卷：616
- 期：Complete
- 页码：773-779
- 全文大小：1332 K
文摘
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PbxSn1 − xS thin films with x from 0.05 to 0.20 were hot wall deposited on glass.
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The PbxSn1 − xS films were annealed in vacuum at 450 °C for 1 h.
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Physical properties of the films were studied with respect to the Pb mole fraction x.