Mechanical reliability of transparent conducting IZTO film electrodes for flexible panel displays

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• 作者：Young Sung Kim^a ; Woo Jin Hwang^a ; Kyung Tae Eun^a ; Sung-Hoon Choa ; ^a ; ^{shchoa@snut.ac.kr"" rel=""nofollow}
• 关键词：Transparent conducting oxide ; Zinc doped In oxide (IZTO) ; Film ; Mechanical reliability ; Flexible panel display
• 刊名：Applied Surface Science
• 出版年：2011
• 出版时间：1 July 2011
• 年：2011
• 卷：257
• 期：18
• 页码：8134-8138
• 全文大小：852 K

文摘

The mechanical reliability of transparent In–Zn–Sn–O (IZTO) films grown using pulsed DC magnetron sputtering with a single oxide alloyed ceramic target on a transparent polyimide (PI) substrate at room temperature is investigated. All IZTO films deposited at room temperature have an amorphous structure. However, their optical and electrical properties change depending on the oxygen partial pressure applied during depositing process. At an oxygen partial pressure of 3 % , the films exhibit a resistivity of 8.3 × 10⁻⁴ Ω cm and an optical transmittance of 86 % . Outer bending tests show that the critical bending radius decreases from 10 mm to 7.5 mm when the oxygen partial pressure increases from 1 % to 3 % . In the inner bending test, the critical bending radius is independent of oxygen partial pressure at 3.5 mm, indicating excellent film flexibility. In the dynamic fatigue test, the electrical resistance of the films reduces by less than 1 % for more than 2000 bending cycles. These results suggest that IZTO films have excellent mechanical durability and flexibility in comparison to ITO films.