Determining aerosol particles by in-air micro-IL analysis combined with micro-PIXE

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• 作者：Wataru Kada ; ^{kada.wataru@jaea.go.jp} ; Takahiro Satoh ; Akihito Yokoyama ; Masashi Koka ; Tomihiro Kamiya
• 关键词：Ion luminescence ; Chemical composition ; Wavelength-dispersive ; Aerosol ; External microbeam ; PIXE
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2013
• 出版时间：1 July, 2013
• 年：2013
• 卷：306
• 期：Complete
• 页码：94-98
• 全文大小：1341 K

文摘

A new external ion microbeam ion luminescence (micro-IL) imaging system was developed on a microbeam line of a 3 MV single-ended accelerator at the TIARA facility of the Japan Atomic Energy Agency. Micro-IL was combined with an in-air micro-PIXE (particle-induced X-ray emission) system to determine the chemical composition and structures of microscopic airborne particles of several micrometers in size. The hardware and software for the combined in-air micro-IL analysis system, called ion luminescence microscopic imaging and spectroscopy (ILUMIS), were studied. Wavelength-dispersive optics, including a collimator lens, a monochromator, and a photon-counting photomultiplier, were installed on the beam line. The signal processing of the IL photon signals, which were collected as spectra and two-dimensional microscopic images, was examined. Several aerosol particles were characterized to demonstrate the ILUMIS/PIXE combined analysis. The external microbeam ILUMIS analysis method provided a variety of information on the chemical and elemental composition of the micrometer-sized aerosol targets under ambient atmospheric conditions.