Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra

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• 作者：Jaak Kõ ; usaar ^{jaak.kousaar@gmail.com" class="auth_mail" title="E-mail the corresponding author}Author Vitae ; Raimund Ubar ; ^{raiub@pld.ttu.ee" class="auth_mail" title="E-mail the corresponding author}Author Vitae ; Sergei DevadzeAuthor Vitae ; Jaan RaikAuthor Vitae
• 关键词：Transition delay faults ; Non-robust and functional sensitization ; Critical path fault tracing ; 7-valued algebra
• 刊名：Microprocessors and Microsystems
• 出版年：2015
• 出版时间：November 2015
• 年：2015
• 卷：39
• 期：8
• 页码：1130-1138
• 全文大小：1057 K

文摘

A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fourth fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs.