An extensive reference dataset for fault detection and identification in batch processes
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- 作者：Jan Van Impe jan.vanimpe@cit.kuleuven.be" class="auth_mail" title="E-mail the corresponding author ; Geert Gins ; geert.gins@cit.kuleuven.be" class="auth_mail" title="E-mail the corresponding author
- 关键词：Batch processes ; Statistical process control (SPM) ; Fault detection ; Fault identification ; Benchmark dataset
- 刊名：Chemometrics and Intelligent Laboratory Systems
- 出版年：2015
- 出版时间：15 November 2015
- 年：2015
- 卷：148
- 期：Complete
- 页码：20-31
- 全文大小：7766 K
文摘
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Extensive benchmark dataset for statistical process monitoring of batch processes
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4 case studies, each of 400 normal and 22,200 faulty batches
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Processes upsets with of various type, magnitude, and onset time
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Good benchmark owing to range in detection difficulty