Microstructural investigation and SnO nanodefects in spray-pyrolyzed SnO₂ thin films

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• 作者：Chanchana Thanachayanont^a ; ^{chanchm@mtec.or.th"" rel=""nofollow} ; Visittapong Yordsri^a ; Chris Boothroyd^b
• 关键词：Spray pyrolysis ; SnO₂ ; SnO ; Nanodefect ; TEM ; CBED
• 刊名：Materials Letters
• 出版年：2011
• 出版时间：September 2011
• 年：2011
• 卷：65
• 期：17-18
• 页码：2610-2613
• 全文大小：589 K

文摘

Spray pyrolysis is one of the most cost-effective methods to prepare SnO₂ films due to its ability to deposit large uniform area, low fabrication cost, simplicity and low deposition temperature. Conventionally, scanning electron microscopy (SEM) and X-Ray Diffraction (XRD) are routinely used to investigate microstructure and crystal structure of the SnO₂ films. In the present study, the SnO₂ films were deposited by spray pyrolysis at 300, 400 and 500 °C and the microstructure of the 500 °C film was further examined by using transmission electron microscopy (TEM) and convergent beam electron diffraction (CBED). It was found that large grain-size vertically-aligned columnar SnO₂ grains were formed after a few layers of small grain-size randomly oriented SnO₂ grains. Moreover, CBED showed the presence of SnO nanodefects that had not been reported before and could not be detected by SEM or XRD.