A study on thickness-dependent magnetotransport properties and terahertz response of Bi2Te3 films.
A signature of topological surface states (TSS) on Bi2Te3 is revealed by 2D WAL magnetoresistance.
The transmittance in 0.25–2.25 THz increases significantly with reducing film thicknesses.
Complex THz conductance is well described by the Drude-Lorentz model.
The TSS penetration depth is found to be approximately 3 QL (quintuple layer).