Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
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- 作者：Diego P. Oyarzú ; na ; diego.oyarzun@unab.cl" class="auth_mail" title="E-mail the corresponding author ; Omar E. Linarez Pé ; rezb ; Manuel Ló ; pez Teijelob ; Cé ; sar Zú ; ñ ; igaa ; Eduardo Jeraldoa ; Daniela A. Geraldoa ; c ; Ramiro Arratia-Pereza ; c
- 关键词：3D confocal microscopy ; Materials characterization ; Thin films ; TiO2 nanoporous ; Tuning fork AFM
- 刊名：Materials Letters
- 出版年：2016
- 出版时间：15 February 2016
- 年：2016
- 卷：165
- 期：Complete
- 页码：67-70
- 全文大小：2849 K
文摘
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AFM and 3D confocal microscopy are powerful tools for porous films characterization.
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AFM is a high sensitive tool for characterizing highly ordered porous nanostructures.
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3D confocal microscopy provides reliable measurements of TiO2 film thickness.