A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials

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• 作者：Alex M. Boehm^a ; Jochen Wieser^b ; Kamal Butrouna^a ; Kenneth R. Graham^a ; ^{Kenneth.graham@uky.edu}
• 关键词：Ultraviolet photoelectron spectroscopy ; Organic semiconductor ; Electronic structure ; NPD ; P3HT
• 刊名：Organic Electronics
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：41
• 期：Complete
• 页码：9-16
• 全文大小：863 K
• 卷排序：41

文摘

New photon source demonstrated for ultraviolet photoelectron spectroscopy (UPS). H Lyman-α photon source (10.2 eV) eliminates sample damage of organics during UPS. Low background emission enables high sensitivity UPS for detecting gap states.