High quality vertically aligned carbon nanotubes (VACNTs) were fabricated on silicon substrate.
VACNTs were transferred from silicon to copper substrate using a novel technique.
Thermal performance was tested using ASTM D5470 methodology.
The lowest thermal resistance achieved was 0.425 cm2-K/W at 50 psi.
Slight pressure dependency was observed from 20 to 50 psi.