Characterization of transferred vertically aligned carbon nanotubes arrays as thermal interface materials
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文摘

High quality vertically aligned carbon nanotubes (VACNTs) were fabricated on silicon substrate.

VACNTs were transferred from silicon to copper substrate using a novel technique.

Thermal performance was tested using ASTM D5470 methodology.

The lowest thermal resistance achieved was 0.425 cm2-K/W at 50 psi.

Slight pressure dependency was observed from 20 to 50 psi.

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