Modeling of X-ray excited luminescence intensity dependence on the nanoparticle size
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- 作者：V. Vistovskyya ; vistvv@gmail.com" class="auth_mail" title="E-mail the corresponding author ; Ya. Chornodolskyya ; A. Gloskovskiib ; S. Syrotyukc ; T. Malyia ; M. Chyliia ; P. Zhmurind ; A. Gektind ; A. Vasil'eve ; A. Voloshinovskiia
- 关键词：LaPO4 ; LuPO4 ; Nanoparticles ; X-ray excited luminescence ; Energy band structure ; Electron thermalization length
- 刊名：Radiation Measurements
- 出版年：2016
- 出版时间：July 2016
- 年：2016
- 卷：90
- 期：Complete
- 页码：174-177
- 全文大小：566 K
文摘
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Distribution of secondary electrons thermalization length is calculated for LaPO4 and LuPO4.
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Dependence of X-ray excited luminescence intensity on the nanoparticle size was simulated.
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Correlation of experimental and simulated dependencies was found.
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The search criteria for scintillating nanoparticles is proposed.