Exploring combined dark and bright field illumination to improve the detection of defects on specular surfaces
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- 作者：Paulo M.F. Fortea ; pauloforte@fisica.uminho.pt" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; P.E.R. FelgueirasaAuthor Vitae ; Flá ; vio P. FerreiraaAuthor Vitae ; M.A. SousaaAuthor Vitae ; Eduardo J. Nunes-Pereiraa ; bAuthor Vitae ; Boris P.J. BretcAuthor Vitae ; Michael S. Belsleya ; bAuthor Vitae
- 关键词：Defect detection ; Specular surfaces ; Automatic optical inspection ; Bright-field illumination ; Dark-field illumination ; Structured light
- 刊名：Optics and Lasers in Engineering
- 出版年：2017
- 出版时间：January 2017
- 年：2017
- 卷：88
- 期：Complete
- 页码：120-128
- 全文大小：3287 K
文摘
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A technique to detect local defects on any polished surface is proposed.
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Both dark and bright-field illuminations of a structured light source are used.
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Scattering as well as absorbing defects can be detected.
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Using a display as light source allows short cycle times and high image contrasts.
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The technique can be adapted to conventional light tubes.