Selected area visualization by FIB-milling for corrosion-microstructure analysis with submicron resolution

详细信息    查看全文

• 作者：Xian Zhang ; ^{xianzh@kth.se} ; Christofer Leygraf ; Inger Odnevall Wallinder
• 关键词：Metals and alloys ; Ion beam technology ; Microstructure ; Local corrosion ; Local probing techniques
• 刊名：Materials Letters
• 出版年：2013
• 出版时间：1 May, 2013
• 年：2013
• 卷：98
• 期：Complete
• 页码：230-233
• 全文大小：606 K

文摘

We report the successful use of focussed ion beam (FIB) milling of trenches in a material of complex microstructure in order to visualize a selected area (32¡Á32 ¦Ìm) for further multi-analysis with submicron resolution. This capability is demonstrated for a Zn-5 wt % Al coating Galfan? on steel. The very same eutectic surface area was analyzed by three complementary and independent techniques providing consistent information on the lateral distribution of morphology and elemental composition (scanning electron microscopy with x-ray microanalysis, SEM/EDS), topography and Volta potential (scanning Kelvin probe force microscopy, SKPFM) and oxide composition (confocal Raman microspectroscopy, CRM). The approach enables a straightforward way to explore the interplay between microstructure and local corrosion of metallic materials.