Correction of nonlinear lateral distortions of scanning probe microscopy images

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• 作者：M. Schnedler ; P.H. Weidlich ; V. Portz ; D. Weber ; R.E. Dunin-Borkowski ; Ph. Ebert
• 关键词：Scanning probe microscopy ; Image distortions ; Correction algorithm ; Calibration
• 刊名：Ultramicroscopy
• 出版年：January, 2014
• 年：2014
• 卷：136
• 期：Complete
• 页码：86-90
• 全文大小：4475 K

文摘

A methodology for the correction of scanning probe microscopy image distortions is demonstrated. It is based on the determination of displacement vectors from the measurement of a calibration sample. By moving the pixels of the distorted scanning probe microscopy image along the displacement vectors an almost complete correction of the nonlinear, time independent distortions is achieved.