Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices

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• 作者：Paolo Magnone^a ; ^{paolo.magnone@unipd.it} ; Pier Andrea Traverso^b ; Claudio Fiegna^b ; ^c
• 关键词：1/f noise ; Flicker noise ; Electron device ; MOSFET ; Non-parametric methods ; Power spectrum ; PSD ; Welch ; Bartlett ; Periodogram
• 刊名：Measurement
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：98
• 期：Complete
• 页码：421-428
• 全文大小：1430 K
• 卷排序：98

文摘

Non-parametric methods for the optimal 1/f noise spectrum estimation are analyzed. Variance of the spectrum is estimated from a single realization. Best performance is achieved with: Welch method; flat top window; 90% of overlap. The smoothing of the correlation is mainly due to the main lobe bandwidth.