Reconstruction of extraordinary refractive index profiles of optical planar waveguides with single or double modes fabricated by O²⁺ ion implantation into lithium niobate

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• 作者：Xiangzhi Liu ; Fei Lu ; Feng Chen ; Yang Tan ; Ruifeng Zhang ; Hanping Liu ; Lei Wang ; Liangling Wang
• 关键词：Ion implantation ; Planar waveguide ; Reconstruction of refractive index profile
• 刊名：Optics Communications
• 出版年：2008
• 出版时间：15 March 2008
• 年：2008
• 卷：281
• 期：6
• 页码：1529-1533
• 全文大小：432 K

文摘

A method named intensity calculation method (ICM), which is based on beam propagation method (BPM) and image processing, was carried out to reconstruct the extraordinary refractive index profile (RIP) of single-mode planar waveguide in lithium niobate (LiNbO₃), which was fabricated by multi-energy megaelectron-volt (MeV) O²⁺ ion implantation. In addition, it has been proved reasonable that the alternation of extraordinary refractive index induced by ion implantation into LiNbO₃ is mainly due to the degradation of polarization and reduction of material physical density. As a result, the possible extraordinary RIP of the double-mode planar waveguide could be reconstructed using BPM according to such a hypothesis and the calculated guiding mode values. The end-fire coupling and m-line arrangements were carried out to obtain the near-field modal patterns and dark-mode spectra of waveguides, respectively.