Annealing temperature effects on Bi6Fe2Ti3O18/LaNiO3/Si thin films by an all-solution approach
详细信息    查看全文
文摘
Bi6Fe2Ti3O18/LaNiO3/Si thin films are successfully prepared by an all-solution route. Annealing temperature effects on microstructures and properties are investigated. Room-temperature multiferroic properties are observed.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700