Applying wedge shape model for calculating both film thickness and optical constants of SeSZn films with high precision for optoelectronic devices
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文摘
Different composition of Se80−xS20Znx films were prepared. Calculation of optical constants of Se80−xS20Znx films using wedge shape model. Determination of film thickness of Se80−xS20Znx films using wedge shape model. The optical band gaps of the films have been determined in terms of Tauc relation. The change in optical parameters were interpreted using chemical bond approaches.

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