Low dielectric loss Ba_0.6Sr_0.4TiO₃/MgTiO₃ composite thin films prepared by a sol-gel process

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• 作者：Yanlong Bian ; Jiwei Zhai ; ^{apzhai@tongji.edu.cn" class="auth_mail}
• 关键词：Sol&ndash ; gel ; BST films ; Composite films ; Dielectric properties
• 刊名：Journal of Physics and Chemistry of Solids
• 出版年：June, 2014
• 年：2014
• 卷：75
• 期：6
• 页码：759-764
• 全文大小：1126 K

文摘

The dielectric properties of Ba_0.6Sr_0.4TiO₃ (BST)/MgTiO₃ (MT) composite thin films deposited on Pt(1 1 1)/Ti/SiO₂/Si(1 0 0) substrates by the sol-gel method were investigated. The X-ray pattern analysis indicates that the thin films exhibit good crystalline quality with perovskite phase and that insertion of MT layer does not obviously affect the phase structure of BST thin films. The characterization of dielectric properties demonstrates that configuration of BST/MT/BST thin films is an effective approach to obtain low dielectric loss and dielectric tunability of BST thin films. At room temperature, the tunability of pure BST60 films and BST/MT (15 nm)/BST composite thin films is 47% and 36%, respectively, at the frequency of 1 MHz with an applied electric field of 400 kV/cm. For BST/MT/BST composite thin films, considerable reduction in the dielectric loss values is observed, which renders them attractive for tunable microwave device applications.