Automatic recognition of epileptic EEG patterns via Extreme Learning Machine and multiresolution feature extraction

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• 作者：Yuedong Song^a ; ^{syd918@gmail.com} ; Jiaxiang Zhang^b
• 关键词：Epilepsy diagnosis ; Electroencephalogram (EEG) ; Multiresolution analysis ; Feature extraction ; Genetic algorithm (GA) ; Extreme Learning Machine (ELM)
• 刊名：Expert Systems with Applications
• 出版年：2013
• 出版时间：15 October, 2013
• 年：2013
• 卷：40
• 期：14
• 页码：5477-5489
• 全文大小：1563 K

文摘

Epilepsy is one of the most common neurological disorders- approximately one in every 100 people worldwide are suffering from it. In this paper, a novel pattern recognition model is presented for automatic epilepsy diagnosis. Wavelet transform is investigated to decompose EEG into five EEG frequency bands which approximate to delta (¦Ä), theta (¦È), alpha (¦Á), beta (¦Â), and gamma (¦Ã) bands. Complexity based features such as permutation entropy (PE), sample entropy (SampEn), and the Hurst exponent (HE) are extracted from both the original EEG signals and each of the frequency bands. The wavelet-based methodology separates the alterations in PE, SampEn, and HE in specific frequency bands of the EEG. The effectiveness of these complexity based measures in discriminating between normal brain state and brain state during the absence of seizures is evaluated using the Extreme Learning Machine (ELM). It is discovered that although there exists no significant differences in the feature values extracted from the original EEG signals, differences can be recognized when the features are examined within specific EEG frequency bands. A genetic algorithm (GA) is developed to choose feature subsets that are effective for enhancing the recognition performance. The GA is also examined for weight alteration for both sensitivity and specificity. The results show that the abnormal EEG diagnosis rate of the model without the involvement of the genetic algorithm is 85.9 % . However, the diagnosis rate of the model increases to 94.2 % when the genetic algorithm is integrated as a feature selector.