Electrochemical migration of tin in thin electrolyte layer containing chloride ions

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• 作者：Xiankang Zhong ; Guoan Zhang ; Yubing Qiu ; Zhenyu Chen ; Xingpeng Guo
• 关键词：A. Tin ; B. SEM ; B. XPS ; C. Anodic dissolution
• 刊名：Corrosion Science
• 出版年：2013
• 出版时间：September, 2013
• 年：2013
• 卷：74
• 期：Complete
• 页码：71-82
• 全文大小：8253 K

文摘

The electrochemical migration of tin in thin electrolyte layers (TELs) containing chloride ions was investigated using in situ electrochemical and optical techniques, as well as ex situ characterization. The results show that tin dendrites co-exist with precipitates in both low and high chloride concentrations, however, in intermediate chloride concentration, no tin dendrites but only precipitates mainly consisting of stannic compounds were observed. The higher bias voltage is applied, the faster rate of ions migration is. Mechanisms have also been proposed to explain the electrochemical migration behaviors.