Microstructure and local electrical investigation of lead-free α-La2WO6 ferroelectric thin films by piezoresponse force microscopy
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- 作者：Thomas Carlier ; Marie-Hé ; lè ; ne Chambrier ; mhelene.chambrier@univ-artois.fr" class="auth_mail" title="E-mail the corresponding author ; Anthony Ferri ; Alexandre Bayart ; Pascal Roussel ; Sé ; bastien Saitzek ; Rachel Desfeux
- 关键词：Thin films ; La2WO6 ; Pulsed laser deposition ; High-resolution X-ray diffraction ; Ferroelectricity ; Piezoresponse force microscopy
- 刊名：Thin Solid Films
- 出版年：2016
- 出版时间：30 October 2016
- 年：2016
- 卷：617
- 期：part_PB
- 页码：76-81
- 全文大小：1246 K
文摘
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Growth of α-La2WO6 thin film by pulsed laser deposition
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Deposition was done on heterostructure (100)-LaNiO3/(100)-LaAlO3.
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Microstructure has been studied by X ray diffraction.
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Piezoresponse force microscopy experiments demonstrate ferroelectric behaviour.