Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study
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- 作者：Simon R. Barea ; simon.bare@honeywell.com" class="auth_mail" title="E-mail the corresponding author ; Axel Knop-Gerickeb ; Detre Teschnerb ; Michael Hä ; vackerb ; Raoul Blumeb ; Tulio Rochac ; Robert Schlö ; glb ; Ally S.Y. Chana ; N. Blackwella ; M.E. Charochaka ; Rik ter Veend ; Hidde H. Brongersmae
- 关键词：Zeolite ; XPS ; X-ray photoelectron spectroscopy ; Low energy ion scattering spectroscopy ; LEIS ; Catalysis
- 刊名：Surface Science
- 出版年：2016
- 出版时间：June 2016
- 年：2016
- 卷：648
- 期：Complete
- 页码：376-382
- 全文大小：927 K
文摘
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Non-destructive depth profiling of Y zeolites used to determine Si/Al ratio
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Laboratory XPS analysis of zeolites does not provide true surface sensitive measurement
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Comprehensive Si/Al depth concentration profile is developed by combining the data from Lab XPS, synchrotron XPS and LEIS