A detailed ray-tracing simulation of the high resolution microbeam at the AIFIRA facility

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• 作者：F. Andersson ; Ph. Barberet ; S. Incerti ; Ph. Moretto
• 关键词：Monte Carlo ; Geant4 ; Ray-tracing ; Ion beam applications
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2008
• 出版时间：April 2008
• 年：2008
• 卷：266
• 期：8
• 页码：1653-1658
• 全文大小：675 K

文摘

The AIFIRA (Applications Interdisciplinaires des Faisceaux d’Ions en Région Aquitaine) ion beam facility at the CENBG (Centre d’Etudes Nucléaires de Bordeaux-Gradignan) is being equipped with a high demagnification focused microbeam line. This beam line, which is under its final stage of development, should allow focusing of protons and alpha particles down to a sub-micrometer resolution, and is therefore referred to as a “nanobeam line” in the following paper.