Film thickness by interference pattern and optical characterization of polyaniline by spectroscopic ellipsometry

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• 作者：Joaquim Brasil de Lima Filho ; ^{joaquimbrasil@ifsc.usp.br} ; Á ; ngel Alberto Hidalgo ^{angel@ufpi.edu.br}
• 关键词：Polyaniline ; Rotating polarizer spectroscopic ellipsometry ; Tauc&ndash ; Lorentz model ; Interference pattern
• 刊名：Synthetic Metals
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：223
• 期：Complete
• 页码：80-86
• 全文大小：856 K
• 卷排序：223

文摘

Analysis interference pattern may interest researchers working with data fitting. Mathematical model polyaniline will be a guide for further researches. This mathematical model allows more confident data analysis from other techniques.