Characterization of indirect X-ray imaging detector based on nanocrystalline gadolinium oxide scintillators for high-resolution imaging application
详细信息    查看全文
文摘
Nanocrystalline Gd2O3:Eu scintillating powders were successfully synthesized through a co-precipitation process for X-ray imaging detector applications. In this work, as-synthesized sample was further calcinated at different temperature, time with 1-10 h and doped-Eu3+ concentration with 1-10 mol % in the electrical furnace. The characterization such as the crystal structures and microstructure of Gd2O3:Eu scintillator were measured by XRD and SEM experiment. The phase transition from cubic to monoclinic structure was observed at 1300 ¡ãC calcination temperature. Dominant emission peak of sample with cubic structure was appeared at 611 nm under 266 nm UV light excitation. After scintillation properties of synthesized Gd2O3:Eu scintillator were investigated, Gd2O3:Eu scintillating films with different thickness was fabricated onto glass substrate by a screen printing method. And then X-ray imaging performance in terms of the light response to X-ray exposure dose, signal-to-noise ratio (SNR) and spatial resolution were measured by combining the fabricated Gd2O3:Eu screen films with a lens-coupled CCD imaging detector under radiographic system conditions.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700