Semi-structured Interview Measure of Stigma (SIMS) in psychosis: Assessment of psychometric properties

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• 作者：Lisa Wood^a ; ^b ; ^{lisawood3@nhs.net" class="auth_mail" title="E-mail the corresponding author} ; Eilish Burke^b ; Rory Byrne^c ; Gabriela Enache^a ; Anthony P. Morrison^b ; ^c
• 关键词：Stigma ; Psychosis ; Schizophrenia ; Semi-structured interview ; Psychometrics
• 刊名：Schizophrenia Research
• 出版年：2016
• 出版时间：October 2016
• 年：2016
• 卷：176
• 期：2-3
• 页码：398-403
• 全文大小：302 K

文摘

Stigma is a significant difficulty for people who experience psychosis. To date, there have been no outcome measures developed to examine stigma exclusively in people with psychosis. The aim of this study was develop and validate a semi-structured interview measure of stigma (SIMS) in psychosis. The SIMS is an eleven item measure of stigma developed in consultation with service users who have experienced psychosis. 79 participants with experience of psychosis were recruited for the purposes of this study. They were administered the SIMS alongside a battery of other relevant outcome measures to examine reliability and validity. A one-factor solution was identified for the SIMS which encompassed all ten rateable items. The measure met all reliability and validity criteria and illustrated good internal consistency, inter-rater reliability, test retest reliability, criterion validity, construct validity, sensitivity to change and had no floor or ceiling effects. The SIMS is a reliable and valid measure of stigma in psychosis. It may be more engaging and acceptable than other stigma measures due to its semi-structured interview format.