The potential of ion beams for characterization of metal-organic frameworks

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• 作者：A. Wagner^a ; S. Pullen^a ; S. Ott^a ; D. Primetzhofer^b ;
• 关键词：RBS ; TOF-MEIS ; TOF-ERDA ; Metal&ndash ; organic framework ; Catalyst
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2016
• 出版时间：15 March 2016
• 年：2016
• 卷：371
• 期：Complete
• 页码：327-331
• 全文大小：589 K

文摘

Ion scattering has been employed for depth-profiling of metal–organic frameworks (MOFs) to characterize the degree of post-synthetic uptake of [FeFe](mcbdt)(CO)₆ (mcbdt = 2,3-dithiolato-benzoic acid). The system investigated consisted of UiO-66 (UiO = University of Oslo) MOF thin films grown on p-type Si wavers in which a molecular proton reduction catalyst [FeFe](mcbdt)(CO)₆ was introduced by postsynthetic exchange (PSE). We have characterized samples by Rutherford Backscattering spectrometry (RBS), Time-of-Flight Elastic Recoil Detection analysis (TOF-ERDA) and by Time-of-Flight Medium Energy Ion Scattering (TOF-MEIS). The beam induced sample modification during the analysis has been characterized by Scanning Electron Microscopy (SEM). No detectable sample modification was found for RBS and TOF-MEIS whereas TOF-ERDA had a clear impact in the present experiment. Composition profiles could be obtained and indicated enrichment of catalyst and/or catalyst residual near to and at the sample surface.