Measurement of proton induced thick target γ-ray yields on B, N, Na, Al and Si from 2.5 to 4.1 MeV

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• 作者：M. Chiari^a ; ^{chiari@fi.infn.it" class="auth_mail" title="E-mail the corresponding author} ; G. Ferraccioli^a ; B. Melon^a ; A. Nannini^a ; A. Perego^a ; L. Salvestrini^a ; A. Lagoyannis^b ; K. Preketes-Sigalas^b
• 关键词：Thick target yields ; PIGE ; Proton ; Angular distribution ; Benchmarking
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2016
• 出版时间：1 January 2016
• 年：2016
• 卷：366
• 期：Complete
• 页码：77-82
• 全文大小：1914 K

文摘

Thick target yields for proton induced γ-ray emission (PIGE) on low-Z nuclei, namely B, N, Na, Al and Si, were measured for proton energies from 2.5 to 4.1 MeV and emission angles of 0°, 45° and 90°, at the 3 MV Tandetron laboratory of INFN-LABEC in Florence. The studied reactions were: ¹⁰B(p,α′γ)⁷Be (E_γ = 429 keV), ¹⁰B(p,p′γ)¹⁰B (E_γ = 718 keV) and ¹¹B(p,p′γ)¹¹B (E_γ = 2125 keV) for boron; ¹⁴N(p,p′γ)¹⁴N (E_γ = 2313 keV) for nitrogen; ²³Na(p,p′γ)²³Na (E_γ = 441 and 1636 keV) and ²³Na(p,α′γ)²⁰Ne (E_γ = 1634 keV) for sodium; ²⁷Al(p,p′γ)²⁷Al (E_γ = 844 and 1014 keV) and ²⁷Al(p,α′γ)²⁴Mg (E_γ = 1369 keV) for aluminum; ²⁸Si(p,p′γ)²⁸Si (E_γ = 1779 keV) and ²⁹Si(p,p′γ)²⁹Si (E_γ = 1273 keV) for silicon. The PIGE thick target yields have been measured with an overall uncertainty typically better than 10%. The use of the measured thick target yield to benchmark and validate experimental cross sections available in the literature is demonstrated.