Interpretation of multiscale characterization techniques to assess ferroelectricity: The case of GaFeO₃

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• 作者：Simon Martin ; ^{simon.martin@insa-lyon.fr} ; Nicolas Baboux ; David Albertini ; Brice Gautier
• 关键词：Piezoresponse Force Microscopy ; PUND ; GaFeO3 ; PbZrTiO3
• 刊名：Ultramicroscopy
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：172
• 期：Complete
• 页码：47-51
• 全文大小：860 K
• 卷排序：172

文摘

Electrical characterization of GaFeO3 multiferroic thin films at room temperature, ferrimagnetic and ferroelectric. Multi-scale characterization : nanoscale with Piezoresponse Force Microscopy and mesoscale with P-V hysteresis loops. Limits of electrical characterization techniques on leaky thin films.