X-ray fluorescence microscopy artefacts in elemental maps of topologically complex samples: Analytical observations, simulation and a map correction method
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- 作者：Fulvio Billè ; a ; George Kourousiasa ; Enrico Luchinatb ; c ; Maya Kiskinovaa ; Alessandra Gianoncellia ; alessandra.gianoncelli@elettra.eu" class="auth_mail" title="E-mail the corresponding author
- 关键词：XRF ; XRF artefacts ; XRF angular dependence ; XRF map correction ; Cell imaging
- 刊名：Spectrochimica Acta Part B: Atomic Spectroscopy
- 出版年：2016
- 出版时间：1 August 2016
- 年：2016
- 卷：122
- 期：Complete
- 页码：23-30
- 全文大小：1505 K
文摘
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XRF maps of topological complex samples can exhibit elemental distribution artefacts.
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A detector response simulation provided insights on the nature of the XRF artefacts.
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A correction method improved the elemental maps of the examined Human HEK293T cells.