Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells
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- 作者：Yongwoo Kwona ; ykwon722@hongik.ac.kr" class="auth_mail" title="E-mail the corresponding author ; Byoungnam Parka ; Heesun Yanga ; Jin-Ha Hwanga ; Dae-Hwan Kangb ; Hongsik Jeongc ; Yunheub Songd
- 关键词：Phase-change memory ; Data retention ; Variability ; Nucleation and growth ; Phase-field method
- 刊名：Microelectronics Reliability
- 出版年：2016
- 出版时间：August 2016
- 年：2016
- 卷：63
- 期：Complete
- 页码：284-290
- 全文大小：1178 K
文摘
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Retention failure of phase-change memory occurs by the spontaneous crystallization of the active material.
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The crystallization including stochastic nucleation was modeled by phase-field method.
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Behaviors of the median and spread of the retention time were quantitatively analyzed for different cell structures.
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The retention time distribution is lognormal for the confined cells while that is Weibull for the mushroom cells.