The progress of X-ray fluorescence computed tomography at SSRF

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• 作者：Biao Deng ; ^{dengbiao@sinap.ac.cn} ; Qun Yang ; Guohao Du ; Yajun Tong ; Honglan Xie ; Tiqiao Xiao ^{tqxiao@sinap.ac.cn}
• 关键词：X-ray fluorescence computed tomography ; Synchrotron radiation ; Element imaging
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2013
• 出版时间：15 June, 2013
• 年：2013
• 卷：305
• 期：Complete
• 页码：5-8
• 全文大小：794 K

文摘

X-ray fluorescence computed tomography is a stimulated emission tomography that allows nondestructive reconstruction of elements distribution in the sample and has been applied in many fields. Since 2007 we have developed X-ray fluorescence tomography for microanalysis. In 2010, the system was established at the Shanghai Synchrotron Radiation Facility (SSRF) and preliminary experimental results were obtained at the X-ray imaging (BL13W1) and hard X-ray micro-focusing beamline (BL15U1). Recently, an ordered-subsets expectation maximization algorithm has been introduced to speed up the data acquisition process. We are now studying accelerating X-ray fluorescence computed tomography based fast scanning and the new algorithm.