Indirect measurement of high grid strip densities over Nyquist sampling rate based on the moiré pattern analysis for quality assurance in grid manufacturing
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- 作者：Uikyu Jea ; Jinsoo Kimb ; Hyosung Choa ; hscho1@yonsei.ac.kr" class="auth_mail" title="E-mail the corresponding author ; Hyunwoo Lima ; Chulkyu Parka ; Guna Kima ; Soyoung Parka ; Yeonok Parka ; Kyuseok Kima ; Taeho Wooa ; Nagkun Chungb ; Jinwon Kimb ; Jinguk Kimb
- 关键词：Moiré ; pattern ; Grid strip density ; Nyquist sampling rate ; Quality assurance
- 刊名：Measurement
- 出版年：2016
- 出版时间：September 2016
- 年：2016
- 卷：91
- 期：Complete
- 页码：634-640
- 全文大小：2416 K
文摘
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Highly precise carbon-interspaced antiscatter grids have been studied.
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Actual grid strip densities over the Nyquist sampling rate are indirectly measured based on the moiré pattern analysis.
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Several grid strip densities in the range of 85–234 lines/in. are investigated.
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The proposed approach is useful for the quality assurance in grid manufacturing.