Defect distribution and microstructure heterogeneity effects on fracture resistance and fatigue behavior of EBM Ti-6Al-4V
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- 作者：Mohsen Seifia ; mohsen.seifi@case.edu" class="auth_mail" title="E-mail the corresponding author ; Ayman Salemb ; Daniel Satkob ; Joshua Shafferb ; John J. Lewandowskia ; JJL3@case.edu" class="auth_mail" title="E-mail the corresponding author
- 关键词：Additive manufacturing ; Ti&ndash ; 6Al&ndash ; 4V ; Electron Beam Melting ; Microstructure ; Defect ; Fracture toughness ; Fatigue crack growth
- 刊名：International Journal of Fatigue
- 出版年：2017
- 出版时间：January 2017
- 年：2017
- 卷：94
- 期：part_P2
- 页码：263-287
- 全文大小：19997 K
文摘
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Comparison of fracture toughness and fatigue crack growth behavior of as-deposited vs HIP EBM Ti-6Al-4V.
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Microstructure (large scale EBSD) and defect (via tomography) characterization of as-deposited vs HIP EBM Ti-6Al-4V.
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Orientation-, location-, and process (as-deposited vs. HIP)- dependence of properties related to microstructure and/or defect characterization.
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Comparison of microstructure/properties obtained on the different generation of EBM machines.
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Use of materials informatics techniques to correlate structure/property relationships.